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X-ray focusing with efficient high-NA multilayer Laue lenses.
Bajt S, Prasciolu M, Fleckenstein H, Domaracký M, Chapman HN, Morgan AJ, Yefanov O, Messerschmidt M, Du Y, Murray KT, Mariani V, Kuhn M, Aplin S, Pande K, Villanueva-Perez P, Stachnik K, Chen JP, Andrejczuk A, Meents A, Burkhardt A, Pennicard D, Huang X, Yan H, Nazaretski E, Chu YS, Hamm CE. Bajt S, et al. Among authors: stachnik k. Light Sci Appl. 2018 Mar 23;7:17162. doi: 10.1038/lsa.2017.162. eCollection 2018. Light Sci Appl. 2018. PMID: 30839543 Free PMC article.
Zernike x-ray ptychography.
Vartiainen I, Mohacsi I, Stachnik K, Guizar-Sicairos M, David C, Meents A. Vartiainen I, et al. Among authors: stachnik k. Opt Lett. 2016 Feb 15;41(4):721-4. doi: 10.1364/OL.41.000721. Opt Lett. 2016. PMID: 26872172
Ptychographic X-ray speckle tracking with multi-layer Laue lens systems.
Morgan AJ, Murray KT, Prasciolu M, Fleckenstein H, Yefanov O, Villanueva-Perez P, Mariani V, Domaracky M, Kuhn M, Aplin S, Mohacsi I, Messerschmidt M, Stachnik K, Du Y, Burkhart A, Meents A, Nazaretski E, Yan H, Huang X, Chu YS, Chapman HN, Bajt S. Morgan AJ, et al. Among authors: stachnik k. J Appl Crystallogr. 2020 Jul 8;53(Pt 4):927-936. doi: 10.1107/S1600576720006925. eCollection 2020 Aug 1. J Appl Crystallogr. 2020. PMID: 32788900 Free PMC article.
14 results