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Use of Spectrum Simulation to Acquire Reliable Scans with a Wavelength Dispersive Spectrometer.
Microsc Microanal. 2023 Jul 22;29(Supplement_1):81-82. doi: 10.1093/micmic/ozad067.032.
Microsc Microanal. 2023.
PMID: 37613371
No abstract available.
Quantification of Trace-Level Silicon Doping in Al x Ga1-xN Films Using Wavelength-Dispersive X-Ray Microanalysis.
Spasevski L, Buse B, Edwards PR, Hunter DA, Enslin J, Foronda HM, Wernicke T, Mehnke F, Parbrook PJ, Kneissl M, Martin RW.
Spasevski L, et al.
Microsc Microanal. 2021 Aug;27(4):696-704. doi: 10.1017/S1431927621000568.
Microsc Microanal. 2021.
PMID: 34218838
Free article.
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