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Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples.
Staeck S, Andrle A, Hönicke P, Baumann J, Grötzsch D, Weser J, Goetzke G, Jonas A, Kayser Y, Förste F, Mantouvalou I, Viefhaus J, Soltwisch V, Stiel H, Beckhoff B, Kanngießer B. Staeck S, et al. Among authors: soltwisch v. Nanomaterials (Basel). 2022 Oct 26;12(21):3766. doi: 10.3390/nano12213766. Nanomaterials (Basel). 2022. PMID: 36364540 Free PMC article.
The anisotropy in the optical constants of quartz crystals for soft X-rays.
Andrle A, Hönicke P, Vinson J, Quintanilha R, Saadeh Q, Heidenreich S, Scholze F, Soltwisch V. Andrle A, et al. Among authors: soltwisch v. J Appl Crystallogr. 2021 Feb 19;54(Pt 2):402-408. doi: 10.1107/S1600576720016325. eCollection 2021 Apr 1. J Appl Crystallogr. 2021. PMID: 33953651 Free PMC article.
Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures.
Hönicke P, Kayser Y, Nikolaev KV, Soltwisch V, Scheerder JE, Fleischmann C, Siefke T, Andrle A, Gwalt G, Siewert F, Davis J, Huth M, Veloso A, Loo R, Skroblin D, Steinert M, Undisz A, Rettenmayr M, Beckhoff B. Hönicke P, et al. Among authors: soltwisch v. Small. 2022 Feb;18(6):e2105776. doi: 10.1002/smll.202105776. Epub 2021 Nov 25. Small. 2022. PMID: 34821030
Hybrid Metrology for Nanostructured Optical Metasurfaces.
Murataj I, Angelini A, Cara E, Porro S, Beckhoff B, Kayser Y, Hönicke P, Ciesielski R, Gollwitzer C, Soltwisch V, Perez-Murano F, Fernandez-Regulez M, Carignano S, Boarino L, Castellino M, Ferrarese Lupi F. Murataj I, et al. Among authors: soltwisch v. ACS Appl Mater Interfaces. 2023 Dec 20;15(50):57992-58002. doi: 10.1021/acsami.3c13923. Epub 2023 Nov 22. ACS Appl Mater Interfaces. 2023. PMID: 37991460 Free PMC article. Review.
23 results