Calibrated nanoscale capacitance measurements using a scanning microwave microscope.
Huber HP, Moertelmaier M, Wallis TM, Chiang CJ, Hochleitner M, Imtiaz A, Oh YJ, Schilcher K, Dieudonne M, Smoliner J, Hinterdorfer P, Rosner SJ, Tanbakuchi H, Kabos P, Kienberger F.
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Rev Sci Instrum. 2010 Nov;81(11):113701. doi: 10.1063/1.3491926.
Rev Sci Instrum. 2010.
PMID: 21133472