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Conductive-probe atomic force microscopy characterization of silicon nanowire.
Alvarez J, Ngo I, Gueunier-Farret ME, Kleider JP, Yu L, Cabarrocas PR, Perraud S, Rouvière E, Celle C, Mouchet C, Simonato JP. Alvarez J, et al. Among authors: simonato jp. Nanoscale Res Lett. 2011 Jan 31;6(1):110. doi: 10.1186/1556-276X-6-110. Nanoscale Res Lett. 2011. PMID: 21711623 Free PMC article.
Growth of one-dimensional Si/SiGe heterostructures by thermal CVD.
Mouchet C, Latu-Romain L, Cayron C, Rouviere E, Celle C, Simonato JP. Mouchet C, et al. Among authors: simonato jp. Nanotechnology. 2008 Aug 20;19(33):335603. doi: 10.1088/0957-4484/19/33/335603. Epub 2008 Jul 7. Nanotechnology. 2008. PMID: 21730625
28 results