Siefke T - Search Results

1

Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces.

Skroblin D, Fernández Herrero A, Siefke T, Nikolaev K, Andrle A, Hönicke P, Kayser Y, Krumrey M, Gollwitzer C, Soltwisch V. Skroblin D, et al. Among authors: siefke t. Nanoscale. 2022 Oct 27;14(41):15475-15483. doi: 10.1039/d2nr03046b. Nanoscale. 2022. PMID: 36226758

2

Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures.

Hönicke P, Kayser Y, Nikolaev KV, Soltwisch V, Scheerder JE, Fleischmann C, Siefke T, Andrle A, Gwalt G, Siewert F, Davis J, Huth M, Veloso A, Loo R, Skroblin D, Steinert M, Undisz A, Rettenmayr M, Beckhoff B. Hönicke P, et al. Among authors: siefke t. Small. 2022 Feb;18(6):e2105776. doi: 10.1002/smll.202105776. Epub 2021 Nov 25. Small. 2022. PMID: 34821030

3

Structured illumination ptychography and at-wavelength characterization with an EUV diffuser at 13.5 nm wavelength.

Eschen W, Liu C, Steinert M, Penagos Molina DS, Siefke T, Zeitner UD, Kasper J, Pertsch T, Limpert J, Rothhardt J. Eschen W, et al. Among authors: siefke t. Opt Express. 2024 Jan 29;32(3):3480-3491. doi: 10.1364/OE.507715. Opt Express. 2024. PMID: 38297568 Free article.

4

Two-Color Spatially Resolved Tuning of Polymer-Coated Metasurfaces.

Walden SL, Poudel P, Zou C, Tanaka K, Paul P, Szeghalmi A, Siefke T, Pertsch T, Schacher FH, Staude I. Walden SL, et al. Among authors: siefke t. ACS Nano. 2024 Feb 13;18(6):5079-5088. doi: 10.1021/acsnano.3c11760. Epub 2024 Jan 30. ACS Nano. 2024. PMID: 38290218 Free PMC article.

5

Quasi-bound states in the continuum for deep subwavelength structural information retrieval for DUV nano-optical polarizers.

Siefke T, Hurtado CBR, Dickmann J, Dickmann W, Käseberg T, Meyer J, Burger S, Zeitner U, Bodermann B, Kroker S. Siefke T, et al. Opt Express. 2020 Aug 3;28(16):23122-23132. doi: 10.1364/OE.396044. Opt Express. 2020. PMID: 32752313 Free article.

6

Bound states in the continuum for optomechanical light control with dielectric metasurfaces.

Rojas Hurtado CB, Dickmann J, Feilong Bruns F, Siefke T, Kroker S. Rojas Hurtado CB, et al. Among authors: siefke t. Opt Express. 2020 Jul 6;28(14):20106-20116. doi: 10.1364/OE.392782. Opt Express. 2020. PMID: 32680078 Free article.

7

Mid-infrared long-pass filter for high-power applications based on grating diffraction.

Gerz D, Schweinberger W, Butler TP, Siefke T, Heusinger M, Amotchkina T, Pervak V, Zeitner U, Pupeza I. Gerz D, et al. Among authors: siefke t. Opt Lett. 2019 Jun 15;44(12):3014-3017. doi: 10.1364/OL.44.003014. Opt Lett. 2019. PMID: 31199369

8

Watt-scale 50-MHz source of single-cycle waveform-stable pulses in the molecular fingerprint region.

Butler TP, Gerz D, Hofer C, Xu J, Gaida C, Heuermann T, Gebhardt M, Vamos L, Schweinberger W, Gessner JA, Siefke T, Heusinger M, Zeitner U, Apolonski A, Karpowicz N, Limpert J, Krausz F, Pupeza I. Butler TP, et al. Among authors: siefke t. Opt Lett. 2019 Apr 1;44(7):1730-1733. doi: 10.1364/OL.44.001730. Opt Lett. 2019. PMID: 30933133

9

Line-edge roughness as a challenge for high-performance wire grid polarizers in the far ultraviolet and beyond.

Siefke T, Heusinger M, Hurtado CBR, Dickmann J, Zeitner U, Tünnermann A, Kroker S. Siefke T, et al. Opt Express. 2018 Jul 23;26(15):19534-19547. doi: 10.1364/OE.26.019534. Opt Express. 2018. PMID: 30114124 Free article.

10

175 nm period grating fabricated by i-line proximity mask-aligner lithography.

Bourgin Y, Voigt D, Käsebier T, Siefke T, Kley EB, Zeitner UD. Bourgin Y, et al. Among authors: siefke t. Opt Lett. 2017 Oct 1;42(19):3816-3819. doi: 10.1364/OL.42.003816. Opt Lett. 2017. PMID: 28957136

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