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Band-bending at buried SiO2/Si interface as probed by XPS.
Çopuroğlu M, Sezen H, Opila RL, Suzer S. Çopuroğlu M, et al. Among authors: sezen h. ACS Appl Mater Interfaces. 2013 Jun 26;5(12):5875-81. doi: 10.1021/am401696e. Epub 2013 Jun 17. ACS Appl Mater Interfaces. 2013. PMID: 23772791 Free article.
Chemical Visualization of a GaN p-n junction by XPS.
Caliskan D, Sezen H, Ozbay E, Suzer S. Caliskan D, et al. Among authors: sezen h. Sci Rep. 2015 Sep 11;5:14091. doi: 10.1038/srep14091. Sci Rep. 2015. PMID: 26359762 Free PMC article.
53 results