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Electric field imaging of single atoms.
Shibata N, Seki T, Sánchez-Santolino G, Findlay SD, Kohno Y, Matsumoto T, Ishikawa R, Ikuhara Y. Shibata N, et al. Among authors: seki t. Nat Commun. 2017 May 30;8:15631. doi: 10.1038/ncomms15631. Nat Commun. 2017. PMID: 28555629 Free PMC article.
Probing the Internal Atomic Charge Density Distributions in Real Space.
Sánchez-Santolino G, Lugg NR, Seki T, Ishikawa R, Findlay SD, Kohno Y, Kanitani Y, Tanaka S, Tomiya S, Ikuhara Y, Shibata N. Sánchez-Santolino G, et al. Among authors: seki t. ACS Nano. 2018 Sep 25;12(9):8875-8881. doi: 10.1021/acsnano.8b03712. Epub 2018 Aug 3. ACS Nano. 2018. PMID: 30074756
Direct electric field imaging of graphene defects.
Ishikawa R, Findlay SD, Seki T, Sánchez-Santolino G, Kohno Y, Ikuhara Y, Shibata N. Ishikawa R, et al. Among authors: seki t. Nat Commun. 2018 Sep 24;9(1):3878. doi: 10.1038/s41467-018-06387-8. Nat Commun. 2018. PMID: 30250209 Free PMC article.
2,507 results