Schröer P - Search Results

1

Working memory load affects intelligence test performance by reducing the strength of relational item bindings and impairing the filtering of irrelevant information.

Schubert AL, Löffler C, Sadus K, Göttmann J, Hein J, Schröer P, Teuber A, Hagemann D. Schubert AL, et al. Among authors: schroer p. Cognition. 2023 Jul;236:105438. doi: 10.1016/j.cognition.2023.105438. Epub 2023 Apr 12. Cognition. 2023. PMID: 37058828

2

[Choosing disposable equipment].

Schröer P. Schröer P. Pflege Aktuell. 2005 Jun;59:340-5. Pflege Aktuell. 2005. PMID: 15966582 German. No abstract available.

3

Reusing single-use devices.

Schroer P. Schroer P. Med Device Technol. 2001 Sep;12(7):7. Med Device Technol. 2001. PMID: 12938551 No abstract available.

4

Reuse of single-use devices.

Schröer P. Schröer P. Med Device Technol. 2000 Dec;11(10):44, 48-53. Med Device Technol. 2000. PMID: 11200156

5

Self-consistent electronic-structure calculations of the (101-bar0) surfaces of the wurtzite compounds ZnO and CdS.

Schröer P, Krüger P, Pollmann J. Schröer P, et al. Phys Rev B Condens Matter. 1994 Jun 15;49(24):17092-17101. doi: 10.1103/physrevb.49.17092. Phys Rev B Condens Matter. 1994. PMID: 10010887 No abstract available.

6

Ab initio calculations of the electronic structure of the wurtzite compounds CdS and CdSe.

Schröer P, Krüger P, Pollmann J. Schröer P, et al. Phys Rev B Condens Matter. 1993 Dec 15;48(24):18264-18267. doi: 10.1103/physrevb.48.18264. Phys Rev B Condens Matter. 1993. PMID: 10008471 No abstract available.

7

First-principles calculation of the electronic structure of the wurtzite semiconductors ZnO and ZnS.

Schröer P, Krüger P, Pollmann J. Schröer P, et al. Phys Rev B Condens Matter. 1993 Mar 15;47(12):6971-6980. doi: 10.1103/physrevb.47.6971. Phys Rev B Condens Matter. 1993. PMID: 10004691 No abstract available.

8

Photophosphorylation: mechanism of reconstitution by coupling factor 1 (CF1).

Berzborn RJ, Schröer P. Berzborn RJ, et al. Among authors: schroer p. FEBS Lett. 1976 Nov;70(1):271-5. doi: 10.1016/0014-5793(76)80773-9. FEBS Lett. 1976. PMID: 186324 Free article. No abstract available.

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