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Bulk sensitive hard x-ray photoemission electron microscopy.
Patt M, Wiemann C, Weber N, Escher M, Gloskovskii A, Drube W, Merkel M, Schneider CM. Patt M, et al. Among authors: schneider cm. Rev Sci Instrum. 2014 Nov;85(11):113704. doi: 10.1063/1.4902141. Rev Sci Instrum. 2014. PMID: 25430117
High resolution, low hν photoelectron spectroscopy with the use of a microwave excited rare gas lamp and ionic crystal filters.
Suga S, Sekiyama A, Funabashi G, Yamaguchi J, Kimura M, Tsujibayashi M, Uyama T, Sugiyama H, Tomida Y, Kuwahara G, Kitayama S, Fukushima K, Kimura K, Yokoi T, Murakami K, Fujiwara H, Saitoh Y, Plucinski L, Schneider CM. Suga S, et al. Among authors: schneider cm. Rev Sci Instrum. 2010 Oct;81(10):105111. doi: 10.1063/1.3488367. Rev Sci Instrum. 2010. PMID: 21034123
209 results