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Precise measurement of the electron beam current in a TEM.
Krause FF, Schowalter M, Oppermann O, Marquardt D, Müller-Caspary K, Ritz R, Simson M, Ryll H, Huth M, Soltau H, Rosenauer A. Krause FF, et al. Among authors: rosenauer a. Ultramicroscopy. 2021 Apr;223:113221. doi: 10.1016/j.ultramic.2021.113221. Epub 2021 Feb 3. Ultramicroscopy. 2021. PMID: 33588232
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data.
Müller K, Schowalter M, Jansen J, Tsuda K, Titantah J, Lamoen D, Rosenauer A. Müller K, et al. Among authors: rosenauer a. Ultramicroscopy. 2009 Jun;109(7):802-14. doi: 10.1016/j.ultramic.2009.03.029. Epub 2009 Mar 21. Ultramicroscopy. 2009. PMID: 19386419
We present a new method to measure structure factors from electron spot diffraction patterns recorded under almost parallel illumination in transmission electron microscopes. ...The precision of both methods is found to be comparable and the results agree well with each ot …
We present a new method to measure structure factors from electron spot diffraction patterns recorded under almost parallel illuminat …
Monolithic ZnTe-based pillar microcavities containing CdTe quantum dots.
Kruse C, Pacuski W, Jakubczyk T, Kobak J, Gaj JA, Frank K, Schowalter M, Rosenauer A, Florian M, Jahnke F, Hommel D. Kruse C, et al. Among authors: rosenauer a. Nanotechnology. 2011 Jul 15;22(28):285204. doi: 10.1088/0957-4484/22/28/285204. Epub 2011 Jun 8. Nanotechnology. 2011. PMID: 21654032
Composition mapping in InGaN by scanning transmission electron microscopy.
Rosenauer A, Mehrtens T, Müller K, Gries K, Schowalter M, Satyam PV, Bley S, Tessarek C, Hommel D, Sebald K, Seyfried M, Gutowski J, Avramescu A, Engl K, Lutgen S. Rosenauer A, et al. Ultramicroscopy. 2011 Jul;111(8):1316-27. doi: 10.1016/j.ultramic.2011.04.009. Epub 2011 Apr 30. Ultramicroscopy. 2011. PMID: 21864772
134 results