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Methods for rapid frequency-domain characterization of leakage currents in silicon nanowire-based field-effect transistors.
Beilstein J Nanotechnol. 2014 Jul 4;5:964-72. doi: 10.3762/bjnano.5.110. eCollection 2014.
Beilstein J Nanotechnol. 2014.
PMID: 25161832
Free PMC article.
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