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Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
Ultramicroscopy. 2016 Oct;169:89-97. doi: 10.1016/j.ultramic.2016.07.001. Epub 2016 Jul 6.
Ultramicroscopy. 2016.
PMID: 27459269
Orientation-distribution mapping of polycrystalline materials by Raman microspectroscopy.
Schmid T, Schäfer N, Levcenko S, Rissom T, Abou-Ras D.
Schmid T, et al. Among authors: rissom t.
Sci Rep. 2015 Dec 17;5:18410. doi: 10.1038/srep18410.
Sci Rep. 2015.
PMID: 26673970
Free PMC article.
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Enhancements in specimen preparation of Cu(In,Ga)(S,Se)2 thin films.
Abou-Ras D, Marsen B, Rissom T, Frost F, Schulz H, Bauer F, Efimova V, Hoffmann V, Eicke A.
Abou-Ras D, et al. Among authors: rissom t.
Micron. 2012 Feb;43(2-3):470-4. doi: 10.1016/j.micron.2011.11.004. Epub 2011 Dec 2.
Micron. 2012.
PMID: 22192980
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