Reiche M - Search Results

1

Improving accuracy and precision of strain analysis by energy-filtered nanobeam electron diffraction.

Hähnel A, Reiche M, Moutanabbir O, Blumtritt H, Geisler H, Höntschel J, Engelmann HJ. Hähnel A, et al. Among authors: reiche m. Microsc Microanal. 2012 Feb;18(1):229-40. doi: 10.1017/S1431927611012657. Microsc Microanal. 2012. PMID: 22258726

2

Observation of free surface-induced bending upon nanopatterning of ultrathin strained silicon layer.

Moutanabbir O, Reiche M, Zakharov N, Naumann F, Petzold M. Moutanabbir O, et al. Among authors: reiche m. Nanotechnology. 2011 Jan 28;22(4):045701. doi: 10.1088/0957-4484/22/4/045701. Epub 2010 Dec 15. Nanotechnology. 2011. PMID: 21157010

3

Nanoscale patterning induced strain redistribution in ultrathin strained Si layers on oxide.

Moutanabbir O, Reiche M, Hähnel A, Erfurth W, Gösele U, Motohashi M, Tarun A, Hayazawa N, Kawata S. Moutanabbir O, et al. Among authors: reiche m. Nanotechnology. 2010 Apr 2;21(13):134013. doi: 10.1088/0957-4484/21/13/134013. Epub 2010 Mar 8. Nanotechnology. 2010. PMID: 20208119

4

Coherent X-ray diffraction imaging and characterization of strain in silicon-on-insulator nanostructures.

Xiong G, Moutanabbir O, Reiche M, Harder R, Robinson I. Xiong G, et al. Among authors: reiche m. Adv Mater. 2014 Dec 10;26(46):7747-63. doi: 10.1002/adma.201304511. Epub 2014 Jun 23. Adv Mater. 2014. PMID: 24955950 Free PMC article.

5

Mapping the "forbidden" transverse-optical phonon in single strained silicon (100) nanowire.

Tarun A, Hayazawa N, Ishitobi H, Kawata S, Reiche M, Moutanabbir O. Tarun A, et al. Among authors: reiche m. Nano Lett. 2011 Nov 9;11(11):4780-8. doi: 10.1021/nl202599q. Epub 2011 Oct 12. Nano Lett. 2011. PMID: 21967475

6

Direct optical mapping of anisotropic stresses in nanowires using transverse optical phonon splitting.

Balois MV, Hayazawa N, Tarun A, Kawata S, Reiche M, Moutanabbir O. Balois MV, et al. Among authors: reiche m. Nano Lett. 2014 Jul 9;14(7):3793-8. doi: 10.1021/nl500891f. Epub 2014 Jun 3. Nano Lett. 2014. PMID: 24867226

7

Extended arrays of vertically aligned sub-10 nm diameter [100] Si nanowires by metal-assisted chemical etching.

Huang Z, Zhang X, Reiche M, Liu L, Lee W, Shimizu T, Senz S, Gösele U. Huang Z, et al. Among authors: reiche m. Nano Lett. 2008 Sep;8(9):3046-51. doi: 10.1021/nl802324y. Epub 2008 Aug 13. Nano Lett. 2008. PMID: 18698834

8

Sub-20 nm Si/Ge superlattice nanowires by metal-assisted etching.

Geyer N, Huang Z, Fuhrmann B, Grimm S, Reiche M, Nguyen-Duc TK, de Boor J, Leipner HS, Werner P, Gösele U. Geyer N, et al. Among authors: reiche m. Nano Lett. 2009 Sep;9(9):3106-10. doi: 10.1021/nl900751g. Nano Lett. 2009. PMID: 19655719

9

Glassy dynamics in condensed isolated polymer chains.

Tress M, Mapesa EU, Kossack W, Kipnusu WK, Reiche M, Kremer F. Tress M, et al. Among authors: reiche m. Science. 2013 Sep 20;341(6152):1371-4. doi: 10.1126/science.1238950. Science. 2013. PMID: 24052303

10

Regular dislocation networks in silicon as a tool for nanostructure devices used in optics, biology, and electronics.

Kittler M, Yu X, Mchedlidze T, Arguirov T, Vyvenko OF, Seifert W, Reiche M, Wilhelm T, Seibt M, Voss O, Wolff A, Fritzsche W. Kittler M, et al. Among authors: reiche m. Small. 2007 Jun;3(6):964-73. doi: 10.1002/smll.200600539. Small. 2007. PMID: 17429814

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