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Unraveling structural and compositional information in 3D FinFET electronic devices.
Sci Rep. 2019 Aug 12;9(1):11629. doi: 10.1038/s41598-019-48117-0.
Sci Rep. 2019.
PMID: 31406211
Free PMC article.
Dynamical effects in strain measurements by dark-field electron holography.
Javon E, Lubk A, Cours R, Reboh S, Cherkashin N, Houdellier F, Gatel C, Hÿtch MJ.
Javon E, et al. Among authors: reboh s.
Ultramicroscopy. 2014 Dec;147:70-85. doi: 10.1016/j.ultramic.2014.06.005. Epub 2014 Jun 30.
Ultramicroscopy. 2014.
PMID: 25062040
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Dynamic scattering theory for dark-field electron holography of 3D strain fields.
Lubk A, Javon E, Cherkashin N, Reboh S, Gatel C, Hÿtch M.
Lubk A, et al. Among authors: reboh s.
Ultramicroscopy. 2014 Jan;136:42-9. doi: 10.1016/j.ultramic.2013.07.007. Epub 2013 Jul 29.
Ultramicroscopy. 2014.
PMID: 24012934
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Composition and local strain mapping in Au-catalyzed axial Si/Ge nanowires.
Vincent L, Boukhicha R, Cherkashin N, Reboh S, Patriarche G, Renard C, Yam V, Fossard F, Bouchier D.
Vincent L, et al. Among authors: reboh s.
Nanotechnology. 2012 Oct 5;23(39):395701. doi: 10.1088/0957-4484/23/39/395701. Epub 2012 Sep 7.
Nanotechnology. 2012.
PMID: 22962281
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