Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Search Results
3 results
Filters applied: . Clear all
Results are displayed in a computed author sort order.
The Results By Year timeline is not available.
Page 1
Total internal reflection ellipsometry: principles and applications.
Appl Opt. 2004 May 20;43(15):3028-36. doi: 10.1364/ao.43.003028.
Appl Opt. 2004.
PMID: 15176189
Total internal reflection ellipsometry: ultrahigh sensitivity for protein adsorption on metal surfaces.
Poksinski M, Arwin H.
Poksinski M, et al.
Opt Lett. 2007 May 15;32(10):1308-10. doi: 10.1364/ol.32.001308.
Opt Lett. 2007.
PMID: 17440570
Item in Clipboard
Formation and cross-linking of fibrinogen layers monitored with in situ spectroscopic ellipsometry.
Berlind T, Poksinski M, Tengvall P, Arwin H.
Berlind T, et al. Among authors: poksinski m.
Colloids Surf B Biointerfaces. 2010 Feb 1;75(2):410-7. doi: 10.1016/j.colsurfb.2009.09.013. Epub 2009 Oct 2.
Colloids Surf B Biointerfaces. 2010.
PMID: 19854626
Item in Clipboard
Cite
Cite