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The soft X-ray and XUV split-and-delay unit at beamlines FL23/24 at FLASH2.
Dreimann M, Wahlert F, Eckermann D, Rosenthal F, Roling S, Reiker T, Kuhlmann M, Toleikis S, Brachmanski M, Treusch R, Plönjes E, Siemer B, Zacharias H. Dreimann M, et al. Among authors: plonjes e. J Synchrotron Radiat. 2023 Mar 1;30(Pt 2):479-489. doi: 10.1107/S1600577523000395. Epub 2023 Feb 15. J Synchrotron Radiat. 2023. PMID: 36891862 Free PMC article.
Hartmann wavefront sensors and their application at FLASH.
Keitel B, Plönjes E, Kreis S, Kuhlmann M, Tiedtke K, Mey T, Schäfer B, Mann K. Keitel B, et al. Among authors: plonjes e. J Synchrotron Radiat. 2016 Jan;23(1):43-9. doi: 10.1107/S1600577515020354. Epub 2016 Jan 1. J Synchrotron Radiat. 2016. PMID: 26698044
Single-shot determination of focused FEL wave fields using iterative phase retrieval.
Mehrjoo M, Giewekemeyer K, Vagovič P, Stern S, Bean R, Messerschmidt M, Keitel B, Plönjes E, Kuhlmann M, Mey T, Schneidmiller EA, Yurkov MV, Limberg T, Mancuso AP. Mehrjoo M, et al. Among authors: plonjes e. Opt Express. 2017 Jul 24;25(15):17892-17903. doi: 10.1364/OE.25.017892. Opt Express. 2017. PMID: 28789279 Free article.
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Milov I, Makhotkin IA, Sobierajski R, Medvedev N, Lipp V, Chalupský J, Sturm JM, Tiedtke K, de Vries G, Störmer M, Siewert F, van de Kruijs R, Louis E, Jacyna I, Jurek M, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H, Bijkerk F. Milov I, et al. Among authors: plonjes e. Opt Express. 2018 Jul 23;26(15):19665-19685. doi: 10.1364/OE.26.019665. Opt Express. 2018. PMID: 30114137 Free article.
Characterization of megahertz X-ray laser beams by multishot desorption imprints in PMMA.
Vozda V, Burian T, Hájková V, Juha L, Enkisch H, Faatz B, Hermann M, Jacyna I, Jurek M, Keitel B, Klinger D, Loch R, Louis E, Makhotkin IA, Plönjes E, Saksl K, Siewert F, Sobierajski R, Strobel S, Tiedtke K, Toleikis S, de Vries G, Zelinger Z, Chalupský J. Vozda V, et al. Among authors: plonjes e. Opt Express. 2020 Aug 31;28(18):25664-25681. doi: 10.1364/OE.396755. Opt Express. 2020. PMID: 32906853 Free article.
Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy.
Ruiz-Lopez M, Mehrjoo M, Keitel B, Plönjes E, Alj D, Dovillaire G, Li L, Zeitoun P. Ruiz-Lopez M, et al. Among authors: plonjes e. Sensors (Basel). 2020 Nov 10;20(22):6426. doi: 10.3390/s20226426. Sensors (Basel). 2020. PMID: 33182797 Free PMC article.
Deep learning for laser beam imprinting.
Chalupský J, Vozda V, Hering J, Kybic J, Burian T, Dziarzhytski S, Frantálová K, Hájková V, Jelínek Š, Juha L, Keitel B, Kuglerová Z, Kuhlmann M, Petryshak B, Ruiz-Lopez M, Vyšín L, Wodzinski T, Plönjes E. Chalupský J, et al. Among authors: plonjes e. Opt Express. 2023 Jun 5;31(12):19703-19721. doi: 10.1364/OE.481776. Opt Express. 2023. PMID: 37381380 Free article.
26 results