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Machine Learning Driven Channel Thickness Optimization in Dual-Layer Oxide Thin-Film Transistors for Advanced Electrical Performance.
Adv Sci (Weinh). 2023 Dec;10(36):e2303589. doi: 10.1002/advs.202303589. Epub 2023 Nov 20.
Adv Sci (Weinh). 2023.
PMID: 37985921
Free PMC article.
Investigation of the Gate Degradation Induced by Forward Gate Voltage Stress in p-GaN Gate High Electron Mobility Transistors.
Chae M, Kim H.
Chae M, et al.
Micromachines (Basel). 2023 Apr 29;14(5):977. doi: 10.3390/mi14050977.
Micromachines (Basel). 2023.
PMID: 37241601
Free PMC article.
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