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Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.
Opt Express. 2020 Nov 23;28(24):36796-36811. doi: 10.1364/OE.412043.
Opt Express. 2020.
PMID: 33379765
Free article.
Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.
Nečas D, Ohlídal I, Franta D, Ohlídal M, Čudek V, Vodák J.
Nečas D, et al. Among authors: ohlidal m.
Appl Opt. 2014 Sep 1;53(25):5606-14. doi: 10.1364/AO.53.005606.
Appl Opt. 2014.
PMID: 25321353
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Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances.
Ohlídal I, Franta D, Ohlídal M, Navrátil K.
Ohlídal I, et al. Among authors: ohlidal m.
Appl Opt. 2001 Nov 1;40(31):5711-7. doi: 10.1364/ao.40.005711.
Appl Opt. 2001.
PMID: 18364860
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Characterization of the basic statistical properties of very rough surfaces of transparent solids by immersion shearing interferometry.
Ohlídal I, Navrátil K, Ohlídal M, Druckmüller M.
Ohlídal I, et al. Among authors: ohlidal m.
Appl Opt. 1994 Dec 1;33(34):7838-45. doi: 10.1364/AO.33.007838.
Appl Opt. 1994.
PMID: 20962997
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