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Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray Spectroscopy.
De Backer A, Zhang Z, van den Bos KHW, Bladt E, Sánchez-Iglesias A, Liz-Marzán LM, Nellist PD, Bals S, Van Aert S. De Backer A, et al. Among authors: nellist pd. Small Methods. 2022 Nov;6(11):e2200875. doi: 10.1002/smtd.202200875. Epub 2022 Sep 30. Small Methods. 2022. PMID: 36180399
Quantitative STEM normalisation: The importance of the electron flux.
Martinez GT, Jones L, De Backer A, Béché A, Verbeeck J, Van Aert S, Nellist PD. Martinez GT, et al. Among authors: nellist pd. Ultramicroscopy. 2015 Dec;159 Pt 1:46-58. doi: 10.1016/j.ultramic.2015.07.010. Epub 2015 Jul 31. Ultramicroscopy. 2015. PMID: 26318098
91 results