Top-down patterning of topological surface and edge states using a focused ion beam.
Bake A, Zhang Q, Ho CS, Causer GL, Zhao W, Yue Z, Nguyen A, Akhgar G, Karel J, Mitchell D, Pastuovic Z, Lewis R, Cole JH, Nancarrow M, Valanoor N, Wang X, Cortie D.
Bake A, et al.
Nat Commun. 2023 Mar 27;14(1):1693. doi: 10.1038/s41467-023-37102-x.
Nat Commun. 2023.
PMID: 36973266
Free PMC article.