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Standards for the Characterization of Endurance in Resistive Switching Devices.
Lanza M, Waser R, Ielmini D, Yang JJ, Goux L, Suñe J, Kenyon AJ, Mehonic A, Spiga S, Rana V, Wiefels S, Menzel S, Valov I, Villena MA, Miranda E, Jing X, Campabadal F, Gonzalez MB, Aguirre F, Palumbo F, Zhu K, Roldan JB, Puglisi FM, Larcher L, Hou TH, Prodromakis T, Yang Y, Huang P, Wan T, Chai Y, Pey KL, Raghavan N, Dueñas S, Wang T, Xia Q, Pazos S. Lanza M, et al. Among authors: mehonic a. ACS Nano. 2021 Nov 23;15(11):17214-17231. doi: 10.1021/acsnano.1c06980. Epub 2021 Nov 3. ACS Nano. 2021. PMID: 34730935 Free article. Review.
Electrically tailored resistance switching in silicon oxide.
Mehonic A, Cueff S, Wojdak M, Hudziak S, Labbé C, Rizk R, Kenyon AJ. Mehonic A, et al. Nanotechnology. 2012 Nov 16;23(45):455201. doi: 10.1088/0957-4484/23/45/455201. Epub 2012 Oct 12. Nanotechnology. 2012. PMID: 23064085
Silicon Oxide (SiOx ): A Promising Material for Resistance Switching?
Mehonic A, Shluger AL, Gao D, Valov I, Miranda E, Ielmini D, Bricalli A, Ambrosi E, Li C, Yang JJ, Xia Q, Kenyon AJ. Mehonic A, et al. Adv Mater. 2018 Oct;30(43):e1801187. doi: 10.1002/adma.201801187. Epub 2018 Jun 29. Adv Mater. 2018. PMID: 29957849 Review.
22 results