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Page 1
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN.
Grieb T, Krause FF, Müller-Caspary K, Ahl JP, Schowalter M, Oppermann O, Hertkorn J, Engl K, Rosenauer A. Grieb T, et al. Among authors: schowalter m. Ultramicroscopy. 2022 Aug;238:113535. doi: 10.1016/j.ultramic.2022.113535. Epub 2022 Apr 26. Ultramicroscopy. 2022. PMID: 35526315
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection.
Grieb T, Krause FF, Müller-Caspary K, Ritz R, Simson M, Schörmann J, Mahr C, Müßener J, Schowalter M, Soltau H, Eickhoff M, Rosenauer A. Grieb T, et al. Among authors: schowalter m. Ultramicroscopy. 2021 Sep;228:113321. doi: 10.1016/j.ultramic.2021.113321. Epub 2021 Jun 17. Ultramicroscopy. 2021. PMID: 34175788
54 results