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Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
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2019 | 2 |
2021 | 3 |
2023 | 1 |
2024 | 0 |
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6 results
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Page 1
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.
Nanomaterials (Basel). 2023 Mar 9;13(6):993. doi: 10.3390/nano13060993.
Nanomaterials (Basel). 2023.
PMID: 36985886
Free PMC article.
Correlative Analysis of the Dimensional Properties of Bipyramidal Titania Nanoparticles by Complementing Electron Microscopy with Other Methods.
Crouzier L, Feltin N, Delvallée A, Pellegrino F, Maurino V, Cios G, Tokarski T, Salzmann C, Deumer J, Gollwitzer C, Hodoroaba VD.
Crouzier L, et al.
Nanomaterials (Basel). 2021 Dec 10;11(12):3359. doi: 10.3390/nano11123359.
Nanomaterials (Basel). 2021.
PMID: 34947708
Free PMC article.
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Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM.
Crouzier L, Delvallée A, Devoille L, Artous S, Saint-Antonin F, Feltin N.
Crouzier L, et al.
Ultramicroscopy. 2021 Jul;226:113300. doi: 10.1016/j.ultramic.2021.113300. Epub 2021 May 4.
Ultramicroscopy. 2021.
PMID: 33984665
Free article.
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Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy.
Monchot P, Coquelin L, Guerroudj K, Feltin N, Delvallée A, Crouzier L, Fischer N.
Monchot P, et al. Among authors: crouzier l.
Nanomaterials (Basel). 2021 Apr 9;11(4):968. doi: 10.3390/nano11040968.
Nanomaterials (Basel). 2021.
PMID: 33918779
Free PMC article.
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A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point.
Crouzier L, Delvallée A, Ducourtieux S, Devoille L, Tromas C, Feltin N.
Crouzier L, et al.
Ultramicroscopy. 2019 Dec;207:112847. doi: 10.1016/j.ultramic.2019.112847. Epub 2019 Sep 25.
Ultramicroscopy. 2019.
PMID: 31586828
Free article.
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Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology.
Crouzier L, Delvallée A, Ducourtieux S, Devoille L, Noircler G, Ulysse C, Taché O, Barruet E, Tromas C, Feltin N.
Crouzier L, et al.
Beilstein J Nanotechnol. 2019 Jul 26;10:1523-1536. doi: 10.3762/bjnano.10.150. eCollection 2019.
Beilstein J Nanotechnol. 2019.
PMID: 31431864
Free PMC article.
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