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Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography.
Hill MO, Calvo-Almazan I, Allain M, Holt MV, Ulvestad A, Treu J, Koblmüller G, Huang C, Huang X, Yan H, Nazaretski E, Chu YS, Stephenson GB, Chamard V, Lauhon LJ, Hruszkewycz SO. Hill MO, et al. Among authors: lauhon lj. Nano Lett. 2018 Feb 14;18(2):811-819. doi: 10.1021/acs.nanolett.7b04024. Epub 2018 Jan 24. Nano Lett. 2018. PMID: 29345956
High-performance and low-power source-gated transistors enabled by a solution-processed metal oxide homojunction.
Zhuang X, Kim JS, Huang W, Chen Y, Wang G, Chen J, Yao Y, Wang Z, Liu F, Yu J, Cheng Y, Yang Z, Lauhon LJ, Marks TJ, Facchetti A. Zhuang X, et al. Among authors: lauhon lj. Proc Natl Acad Sci U S A. 2023 Jan 17;120(3):e2216672120. doi: 10.1073/pnas.2216672120. Epub 2023 Jan 11. Proc Natl Acad Sci U S A. 2023. PMID: 36630451 Free PMC article.
106 results