Fast fitting of reflectivity data of growing thin films using neural networks.
Greco A, Starostin V, Karapanagiotis C, Hinderhofer A, Gerlach A, Pithan L, Liehr S, Schreiber F, Kowarik S.
Greco A, et al. Among authors: kowarik s.
J Appl Crystallogr. 2019 Nov 8;52(Pt 6):1342-1347. doi: 10.1107/S1600576719013311. eCollection 2019 Dec 1.
J Appl Crystallogr. 2019.
PMID: 31798360
Free PMC article.