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Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses.
Chalupský J, Juha L, Hájková V, Cihelka J, Vysín L, Gautier J, Hajdu J, Hau-Riege SP, Jurek M, Krzywinski J, London RA, Papalazarou E, Pelka JB, Rey G, Sebban S, Sobierajski R, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Valentin C, Wabnitz H, Zeitoun P. Chalupský J, et al. Among authors: juha l. Opt Express. 2009 Jan 5;17(1):208-17. doi: 10.1364/oe.17.000208. Opt Express. 2009. PMID: 19129890 Free article.
Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids.
Chalupský J, Juha L, Kuba J, Cihelka J, Hájková V, Koptyaev S, Krása J, Velyhan A, Bergh M, Caleman C, Hajdu J, Bionta RM, Chapman H, Hau-Riege SP, London RA, Jurek M, Krzywinski J, Nietubyc R, Pelka JB, Sobierajski R, Meyer-Ter-Vehn J, Tronnier A, Sokolowski-Tinten K, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Wabnitz H, Zastrau U. Chalupský J, et al. Among authors: juha l. Opt Express. 2007 May 14;15(10):6036-43. doi: 10.1364/oe.15.006036. Opt Express. 2007. PMID: 19546907 Free article.
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.
Nelson AJ, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L, Burian T, Kozlova M, Fäustlin RR, Nagler B, Vinko SM, Whitcher T, Dzelzainis T, Renner O, Saksl K, Khorsand AR, Heimann PA, Sobierajski R, Klinger D, Jurek M, Pelka J, Iwan B, Andreasson J, Timneanu N, Fajardo M, Wark JS, Riley D, Tschentscher T, Hajdu J, Lee RW. Nelson AJ, et al. Among authors: juha l. Opt Express. 2009 Sep 28;17(20):18271-8. doi: 10.1364/OE.17.018271. Opt Express. 2009. PMID: 19907618 Free article.
Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure.
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson EM, Bijkerk F. Khorsand AR, et al. Among authors: juha l. Opt Express. 2010 Jan 18;18(2):700-12. doi: 10.1364/OE.18.000700. Opt Express. 2010. PMID: 20173890 Free article.
Spot size characterization of focused non-Gaussian X-ray laser beams.
Chalupský J, Krzywinski J, Juha L, Hájková V, Cihelka J, Burian T, Vysín L, Gaudin J, Gleeson A, Jurek M, Khorsand AR, Klinger D, Wabnitz H, Sobierajski R, Störmer M, Tiedtke K, Toleikis S. Chalupský J, et al. Among authors: juha l. Opt Express. 2010 Dec 20;18(26):27836-45. doi: 10.1364/OE.18.027836. Opt Express. 2010. PMID: 21197057 Free article.
62 results