Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2009 | 1 |
2019 | 1 |
2024 | 0 |
Search Results
2 results
Results by year
Filters applied: . Clear all
Page 1
Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation.
Appl Spectrosc. 2019 Mar;73(3):261-270. doi: 10.1177/0003702819826280. Epub 2019 Feb 20.
Appl Spectrosc. 2019.
PMID: 30784293
Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives.
Losurdo M, Bergmair M, Bruno G, Cattelan D, Cobet C, de Martino A, Fleischer K, Dohcevic-Mitrovic Z, Esser N, Galliet M, Gajic R, Hemzal D, Hingerl K, Humlicek J, Ossikovski R, Popovic ZV, Saxl O.
Losurdo M, et al. Among authors: humlicek j.
J Nanopart Res. 2009 Oct;11(7):1521-1554. doi: 10.1007/s11051-009-9662-6. Epub 2009 Jun 12.
J Nanopart Res. 2009.
PMID: 21170135
Free PMC article.
Item in Clipboard
Cite
Cite