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Thickness variations and absence of lateral compositional fluctuations in aberration-corrected STEM images of InGaN LED active regions at low dose.
Microsc Microanal. 2014 Jun;20(3):864-8. doi: 10.1017/S1431927614000427. Epub 2014 Mar 26.
Microsc Microanal. 2014.
PMID: 24667066
Determination of the concentration of impurities in GaN from photoluminescence and secondary-ion mass spectrometry.
Reshchikov MA, Vorobiov M, Andrieiev O, Ding K, Izyumskaya N, Avrutin V, Usikov A, Helava H, Makarov Y.
Reshchikov MA, et al. Among authors: izyumskaya n.
Sci Rep. 2020 Feb 10;10(1):2223. doi: 10.1038/s41598-020-59033-z.
Sci Rep. 2020.
PMID: 32041980
Free PMC article.
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