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Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory.
Nanomaterials (Basel). 2023 Jul 19;13(14):2104. doi: 10.3390/nano13142104.
Nanomaterials (Basel). 2023.
PMID: 37513115
Free PMC article.
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