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Quantified density of performance-degrading near-interface traps in SiC MOSFETs.
Sci Rep. 2022 Mar 8;12(1):4076. doi: 10.1038/s41598-022-08014-5.
Sci Rep. 2022.
PMID: 35260739
Free PMC article.
Integrated, Transparent Silicon Carbide Electronics and Sensors for Radio Frequency Biomedical Therapy.
Nguyen TK, Yadav S, Truong TA, Han M, Barton M, Leitch M, Guzman P, Dinh T, Ashok A, Vu H, Dau V, Haasmann D, Chen L, Park Y, Do TN, Yamauchi Y, Rogers JA, Nguyen NT, Phan HP.
Nguyen TK, et al. Among authors: haasmann d.
ACS Nano. 2022 Jul 26;16(7):10890-10903. doi: 10.1021/acsnano.2c03188. Epub 2022 Jul 11.
ACS Nano. 2022.
PMID: 35816450
Free PMC article.
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The effect of wafer thinning and thermal capacitance on chip temperature of SiC Schottky diodes during surge currents.
Damcevska J, Dimitrijev S, Haasmann D, Tanner P.
Damcevska J, et al. Among authors: haasmann d.
Sci Rep. 2023 Nov 6;13(1):19189. doi: 10.1038/s41598-023-46538-6.
Sci Rep. 2023.
PMID: 37932325
Free PMC article.
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