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Effect of Dopants, Impurities, and Substrate on Anomalous Crystallization of SiN.
Microsc Microanal. 2023 Jul 22;29(Supplement_1):1470-1471. doi: 10.1093/micmic/ozad067.755.
Microsc Microanal. 2023.
PMID: 37613606
No abstract available.
Determining Stress in Metallic Conducting Layers of Microelectronics Devices Using High Resolution Electron Backscatter Diffraction and Finite Element Analysis.
Ruggles T, Grutzik S, Stephens K, Michael J.
Ruggles T, et al. Among authors: grutzik s.
Microsc Microanal. 2023 Apr 5;29(2):490-498. doi: 10.1093/micmic/ozad013.
Microsc Microanal. 2023.
PMID: 37749744
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Statistical mechanical model for crack growth.
Buche MR, Grutzik SJ.
Buche MR, et al. Among authors: grutzik sj.
Phys Rev E. 2024 Jan;109(1-2):015001. doi: 10.1103/PhysRevE.109.015001.
Phys Rev E. 2024.
PMID: 38366446
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Freely jointed chain models with extensible links.
Buche MR, Silberstein MN, Grutzik SJ.
Buche MR, et al. Among authors: grutzik sj.
Phys Rev E. 2022 Aug;106(2-1):024502. doi: 10.1103/PhysRevE.106.024502.
Phys Rev E. 2022.
PMID: 36109919
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Nondegenerate Parametric Resonance in Large Ensembles of Coupled Micromechanical Cantilevers with Varying Natural Frequencies.
Wallin CB, De Alba R, Westly D, Holland G, Grutzik S, Rand RH, Zehnder AT, Aksyuk VA, Krylov S, Ilic BR.
Wallin CB, et al. Among authors: grutzik s.
Phys Rev Lett. 2018 Dec 28;121(26):264301. doi: 10.1103/PhysRevLett.121.264301.
Phys Rev Lett. 2018.
PMID: 30636140
Free PMC article.
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Actuation of higher harmonics in large arrays of micromechanical cantilevers for expanded resonant peak separation.
Dick N, Wallin CB, Krylov S, Grutzik S, Ilic BR, Zehnder AT.
Dick N, et al. Among authors: grutzik s.
J Vib Acoust. 2018;140:10.1115/1.4039568. doi: 10.1115/1.4039568.
J Vib Acoust. 2018.
PMID: 31080325
Free PMC article.
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Accurate spring constant calibration for very stiff atomic force microscopy cantilevers.
Grutzik SJ, Gates RS, Gerbig YB, Smith DT, Cook RF, Zehnder AT.
Grutzik SJ, et al.
Rev Sci Instrum. 2013 Nov;84(11):113706. doi: 10.1063/1.4832978.
Rev Sci Instrum. 2013.
PMID: 24289403
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Zn cluster drifting effect for the formation of ZnO 3D nanoarchitecture.
Shi J, Grutzik S, Wang X.
Shi J, et al. Among authors: grutzik s.
ACS Nano. 2009 Jun 23;3(6):1594-602. doi: 10.1021/nn900388z.
ACS Nano. 2009.
PMID: 19545169
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