Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Search Results
2 results
Filters applied: . Clear all
Results are displayed in a computed author sort order.
The Results By Year timeline is not available.
Page 1
Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi2Se3 Thin Films.
Materials (Basel). 2023 Mar 10;16(6):2244. doi: 10.3390/ma16062244.
Materials (Basel). 2023.
PMID: 36984129
Free PMC article.
Omnipresence of Weak Antilocalization (WAL) in Bi2Se3 Thin Films: A Review on Its Origin.
Gracia-Abad R, Sangiao S, Bigi C, Kumar Chaluvadi S, Orgiani P, De Teresa JM.
Gracia-Abad R, et al.
Nanomaterials (Basel). 2021 Apr 22;11(5):1077. doi: 10.3390/nano11051077.
Nanomaterials (Basel). 2021.
PMID: 33922019
Free PMC article.
Review.
Item in Clipboard
Cite
Cite