Galtier EC - Search Results

1

Perfect X-ray focusing via fitting corrective glasses to aberrated optics.

Seiboth F, Schropp A, Scholz M, Wittwer F, Rödel C, Wünsche M, Ullsperger T, Nolte S, Rahomäki J, Parfeniukas K, Giakoumidis S, Vogt U, Wagner U, Rau C, Boesenberg U, Garrevoet J, Falkenberg G, Galtier EC, Ja Lee H, Nagler B, Schroer CG. Seiboth F, et al. Among authors: galtier ec. Nat Commun. 2017 Mar 1;8:14623. doi: 10.1038/ncomms14623. Nat Commun. 2017. PMID: 28248317 Free PMC article.

2

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser.

Nilsson D, Uhlén F, Holmberg A, Hertz HM, Schropp A, Patommel J, Hoppe R, Seiboth F, Meier V, Schroer CG, Galtier E, Nagler B, Lee HJ, Vogt U. Nilsson D, et al. Opt Lett. 2012 Dec 15;37(24):5046-8. doi: 10.1364/OL.37.005046. Opt Lett. 2012. PMID: 23258000

3

Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging.

Schropp A, Hoppe R, Meier V, Patommel J, Seiboth F, Lee HJ, Nagler B, Galtier EC, Arnold B, Zastrau U, Hastings JB, Nilsson D, Uhlén F, Vogt U, Hertz HM, Schroer CG. Schropp A, et al. Among authors: galtier ec. Sci Rep. 2013;3:1633. doi: 10.1038/srep01633. Sci Rep. 2013. PMID: 23567281 Free PMC article.

4

Damage investigation on tungsten and diamond diffractive optics at a hard x-ray free-electron laser.

Uhlén F, Nilsson D, Holmberg A, Hertz HM, Schroer CG, Seiboth F, Patommel J, Meier V, Hoppe R, Schropp A, Lee HJ, Nagler B, Galtier E, Krzywinski J, Sinn H, Vogt U. Uhlén F, et al. Opt Express. 2013 Apr 8;21(7):8051-61. doi: 10.1364/OE.21.008051. Opt Express. 2013. PMID: 23571895 Free article.

5

Bent crystal spectrometer for both frequency and wavenumber resolved x-ray scattering at a seeded free-electron laser.

Zastrau U, Fletcher LB, Förster E, Galtier ECh, Gamboa E, Glenzer SH, Heimann P, Marschner H, Nagler B, Schropp A, Wehrhan O, Lee HJ. Zastrau U, et al. Among authors: galtier ech. Rev Sci Instrum. 2014 Sep;85(9):093106. doi: 10.1063/1.4894821. Rev Sci Instrum. 2014. PMID: 25273706

6

The Matter in Extreme Conditions instrument at the Linac Coherent Light Source.

Nagler B, Arnold B, Bouchard G, Boyce RF, Boyce RM, Callen A, Campell M, Curiel R, Galtier E, Garofoli J, Granados E, Hastings J, Hays G, Heimann P, Lee RW, Milathianaki D, Plummer L, Schropp A, Wallace A, Welch M, White W, Xing Z, Yin J, Young J, Zastrau U, Lee HJ. Nagler B, et al. J Synchrotron Radiat. 2015 May;22(3):520-5. doi: 10.1107/S1600577515004865. Epub 2015 Apr 21. J Synchrotron Radiat. 2015. PMID: 25931063 Free PMC article.

7

Imaging Shock Waves in Diamond with Both High Temporal and Spatial Resolution at an XFEL.

Schropp A, Hoppe R, Meier V, Patommel J, Seiboth F, Ping Y, Hicks DG, Beckwith MA, Collins GW, Higginbotham A, Wark JS, Lee HJ, Nagler B, Galtier EC, Arnold B, Zastrau U, Hastings JB, Schroer CG. Schropp A, et al. Among authors: galtier ec. Sci Rep. 2015 Jun 18;5:11089. doi: 10.1038/srep11089. Sci Rep. 2015. PMID: 26086176 Free PMC article.

8

Ultrafast visualization of crystallization and grain growth in shock-compressed SiO2.

Gleason AE, Bolme CA, Lee HJ, Nagler B, Galtier E, Milathianaki D, Hawreliak J, Kraus RG, Eggert JH, Fratanduono DE, Collins GW, Sandberg R, Yang W, Mao WL. Gleason AE, et al. Nat Commun. 2015 Sep 4;6:8191. doi: 10.1038/ncomms9191. Nat Commun. 2015. PMID: 26337754 Free PMC article.

9

Compound refractive lenses as prefocusing optics for X-ray FEL radiation.

Heimann P, MacDonald M, Nagler B, Lee HJ, Galtier E, Arnold B, Xing Z. Heimann P, et al. J Synchrotron Radiat. 2016 Mar;23(2):425-9. doi: 10.1107/S1600577516001636. Epub 2016 Feb 17. J Synchrotron Radiat. 2016. PMID: 26917128 Free PMC article.

10

The phase-contrast imaging instrument at the matter in extreme conditions endstation at LCLS.

Nagler B, Schropp A, Galtier EC, Arnold B, Brown SB, Fry A, Gleason A, Granados E, Hashim A, Hastings JB, Samberg D, Seiboth F, Tavella F, Xing Z, Lee HJ, Schroer CG. Nagler B, et al. Among authors: galtier ec. Rev Sci Instrum. 2016 Oct;87(10):103701. doi: 10.1063/1.4963906. Rev Sci Instrum. 2016. PMID: 27802688

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