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Defect scattering in graphene.
Chen JH, Cullen WG, Jang C, Fuhrer MS, Williams ED. Chen JH, et al. Among authors: fuhrer ms. Phys Rev Lett. 2009 Jun 12;102(23):236805. doi: 10.1103/PhysRevLett.102.236805. Epub 2009 Jun 12. Phys Rev Lett. 2009. PMID: 19658959
High-fidelity conformation of graphene to SiO2 topographic features.
Cullen WG, Yamamoto M, Burson KM, Chen JH, Jang C, Li L, Fuhrer MS, Williams ED. Cullen WG, et al. Among authors: fuhrer ms. Phys Rev Lett. 2010 Nov 19;105(21):215504. doi: 10.1103/PhysRevLett.105.215504. Epub 2010 Nov 19. Phys Rev Lett. 2010. PMID: 21231322
Correlated charged impurity scattering in graphene.
Yan J, Fuhrer MS. Yan J, et al. Among authors: fuhrer ms. Phys Rev Lett. 2011 Nov 11;107(20):206601. doi: 10.1103/PhysRevLett.107.206601. Epub 2011 Nov 7. Phys Rev Lett. 2011. PMID: 22181752
Dual-gated bilayer graphene hot-electron bolometer.
Yan J, Kim MH, Elle JA, Sushkov AB, Jenkins GS, Milchberg HM, Fuhrer MS, Drew HD. Yan J, et al. Among authors: fuhrer ms. Nat Nanotechnol. 2012 Jun 3;7(7):472-8. doi: 10.1038/nnano.2012.88. Nat Nanotechnol. 2012. PMID: 22659611
100 results