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Year | Number of Results |
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2019 | 1 |
2021 | 2 |
2023 | 1 |
2024 | 1 |
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A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning.
Ultramicroscopy. 2024 Apr 10;262:113965. doi: 10.1016/j.ultramic.2024.113965. Online ahead of print.
Ultramicroscopy. 2024.
PMID: 38640578
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Müllerová I, Konvalina I, Zouhar M, Paták A, Daniel B, Pru Cha L, Piňos J, Materna Mikmeková E.
Müllerová I, et al. Among authors: materna mikmekova e.
Microsc Microanal. 2023 Jul 22;29(Supplement_1):1861-1862. doi: 10.1093/micmic/ozad067.960.
Microsc Microanal. 2023.
PMID: 37613875
No abstract available.
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Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors.
Konvalina I, Paták A, Zouhar M, Müllerová I, Fořt T, Unčovský M, Materna Mikmeková E.
Konvalina I, et al. Among authors: materna mikmekova e.
Nanomaterials (Basel). 2021 Dec 28;12(1):71. doi: 10.3390/nano12010071.
Nanomaterials (Basel). 2021.
PMID: 35010021
Free PMC article.
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Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer.
Konvalina I, Daniel B, Zouhar M, Paták A, Müllerová I, Frank L, Piňos J, Průcha L, Radlička T, Werner WSM, Mikmeková EM.
Konvalina I, et al. Among authors: mikmekova em.
Nanomaterials (Basel). 2021 Sep 18;11(9):2435. doi: 10.3390/nano11092435.
Nanomaterials (Basel). 2021.
PMID: 34578750
Free PMC article.
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In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
Konvalina I, Mika F, Krátký S, Materna Mikmeková E, Müllerová I.
Konvalina I, et al. Among authors: materna mikmekova e.
Materials (Basel). 2019 Jul 19;12(14):2307. doi: 10.3390/ma12142307.
Materials (Basel). 2019.
PMID: 31330942
Free PMC article.
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