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Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology.
Beilstein J Nanotechnol. 2019 Jul 26;10:1523-1536. doi: 10.3762/bjnano.10.150. eCollection 2019.
Beilstein J Nanotechnol. 2019.
PMID: 31431864
Free PMC article.
Characterization of aerosols and fibers emitted from composite materials combustion.
Chivas-Joly C, Gaie-Levrel F, Motzkus C, Ducourtieux S, Delvallée A, De Lagos F, Nevé SL, Gutierrez J, Lopez-Cuesta JM.
Chivas-Joly C, et al. Among authors: ducourtieux s.
J Hazard Mater. 2016 Jan 15;301:153-62. doi: 10.1016/j.jhazmat.2015.08.043. Epub 2015 Aug 28.
J Hazard Mater. 2016.
PMID: 26348148
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A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point.
Crouzier L, Delvallée A, Ducourtieux S, Devoille L, Tromas C, Feltin N.
Crouzier L, et al. Among authors: ducourtieux s.
Ultramicroscopy. 2019 Dec;207:112847. doi: 10.1016/j.ultramic.2019.112847. Epub 2019 Sep 25.
Ultramicroscopy. 2019.
PMID: 31586828
Free article.
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Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison.
Bu T, Gao H, Yao Y, Wang J, Pollard AJ, Legge EJ, Clifford CA, Delvallée A, Ducourtieux S, Lawn MA, Babic B, Coleman VA, Jämting Å, Zou S, Chen M, Jakubek ZJ, Iacob E, Chanthawong N, Mongkolsuttirat K, Zeng G, Almeida CM, He BC, Hyde L, Ren L.
Bu T, et al. Among authors: ducourtieux s.
Nanotechnology. 2023 Mar 16;34(22). doi: 10.1088/1361-6528/acbf58.
Nanotechnology. 2023.
PMID: 36848668
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Comparison of test images obtained from various configurations of scanning near-field optical microscopes.
Bainier C, Vannier C, Courjon D, Rivoal JC, Ducourtieux S, De Wilde Y, Aigouy L, Formanek F, Belliard L, Siry P, Perrin B.
Bainier C, et al. Among authors: ducourtieux s.
Appl Opt. 2003 Feb 1;42(4):691-700. doi: 10.1364/ao.42.000691.
Appl Opt. 2003.
PMID: 12564488
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