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Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison.
Bu T, Gao H, Yao Y, Wang J, Pollard AJ, Legge EJ, Clifford CA, Delvallée A, Ducourtieux S, Lawn MA, Babic B, Coleman VA, Jämting Å, Zou S, Chen M, Jakubek ZJ, Iacob E, Chanthawong N, Mongkolsuttirat K, Zeng G, Almeida CM, He BC, Hyde L, Ren L. Bu T, et al. Among authors: delvallee a. Nanotechnology. 2023 Mar 16;34(22). doi: 10.1088/1361-6528/acbf58. Nanotechnology. 2023. PMID: 36848668
Characterization of aerosols and fibers emitted from composite materials combustion.
Chivas-Joly C, Gaie-Levrel F, Motzkus C, Ducourtieux S, Delvallée A, De Lagos F, Nevé SL, Gutierrez J, Lopez-Cuesta JM. Chivas-Joly C, et al. Among authors: delvallee a. J Hazard Mater. 2016 Jan 15;301:153-62. doi: 10.1016/j.jhazmat.2015.08.043. Epub 2015 Aug 28. J Hazard Mater. 2016. PMID: 26348148
Correlative Analysis of the Dimensional Properties of Bipyramidal Titania Nanoparticles by Complementing Electron Microscopy with Other Methods.
Crouzier L, Feltin N, Delvallée A, Pellegrino F, Maurino V, Cios G, Tokarski T, Salzmann C, Deumer J, Gollwitzer C, Hodoroaba VD. Crouzier L, et al. Among authors: delvallee a. Nanomaterials (Basel). 2021 Dec 10;11(12):3359. doi: 10.3390/nano11123359. Nanomaterials (Basel). 2021. PMID: 34947708 Free PMC article.
Scanning microwave microscopy applied to semiconducting GaAs structures.
Buchter A, Hoffmann J, Delvallée A, Brinciotti E, Hapiuk D, Licitra C, Louarn K, Arnoult A, Almuneau G, Piquemal F, Zeier M, Kienberger F. Buchter A, et al. Among authors: delvallee a. Rev Sci Instrum. 2018 Feb;89(2):023704. doi: 10.1063/1.5015966. Rev Sci Instrum. 2018. PMID: 29495818
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.
Feltin N, Crouzier L, Delvallée A, Pellegrino F, Maurino V, Bartczak D, Goenaga-Infante H, Taché O, Marguet S, Testard F, Artous S, Saint-Antonin F, Salzmann C, Deumer J, Gollwitzer C, Koops R, Sebaïhi N, Fontanges R, Neuwirth M, Bergmann D, Hüser D, Klein T, Hodoroaba VD. Feltin N, et al. Among authors: delvallee a. Nanomaterials (Basel). 2023 Mar 9;13(6):993. doi: 10.3390/nano13060993. Nanomaterials (Basel). 2023. PMID: 36985886 Free PMC article.
11 results