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Instrument-model refinement in normalized reciprocal-vector space for X-ray Laue diffraction.
J Appl Crystallogr. 2020 Sep 29;53(Pt 5):1370-1375. doi: 10.1107/S1600576720011929. eCollection 2020 Oct 1.
J Appl Crystallogr. 2020.
PMID: 33122973
Free PMC article.
Seed-skewness algorithm for X-ray diffraction signal detection in time-resolved synchrotron Laue photocrystallography.
Szarejko D, Kamiński R, Łaski P, Jarzembska KN.
Szarejko D, et al.
J Synchrotron Radiat. 2020 Mar 1;27(Pt 2):405-413. doi: 10.1107/S1600577520000077. Epub 2020 Feb 11.
J Synchrotron Radiat. 2020.
PMID: 32153279
Free PMC article.
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