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Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy.
Nanomaterials (Basel). 2021 Nov 17;11(11):3104. doi: 10.3390/nano11113104.
Nanomaterials (Basel). 2021.
PMID: 34835868
Free PMC article.
Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy.
Piquemal F, Morán-Meza J, Delvallée A, Richert D, Kaja K.
Piquemal F, et al. Among authors: richert d.
Nanomaterials (Basel). 2021 Mar 23;11(3):820. doi: 10.3390/nano11030820.
Nanomaterials (Basel). 2021.
PMID: 33806948
Free PMC article.
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