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TEM characterization of MBE grown CdTe/ZnTe axial nanowires.
Dłuzewski P, Janik E, Kret S, Zaleszczyk W, Tang D, Karczewski G, Wojtowicz T. Dłuzewski P, et al. J Microsc. 2010 Mar;237(3):337-40. doi: 10.1111/j.1365-2818.2009.03256.x. J Microsc. 2010. PMID: 20500392
Zn(1-x)Mg(x)Te nanowires grown by solid source molecular beam epitaxy.
Janik E, Dynowska E, Dłużewski P, Kret S, Presz A, Zaleszczyk W, Szuszkiewicz W, Morhange JF, Petroutchik A, Maćkowski S, Wojtowicz T. Janik E, et al. Among authors: dluzewski p. Nanotechnology. 2008 Sep 10;19(36):365606. doi: 10.1088/0957-4484/19/36/365606. Epub 2008 Jul 28. Nanotechnology. 2008. PMID: 21828877
Zn(1-x)MnxTe diluted magnetic semiconductor nanowires grown by molecular beam epitaxy.
Zaleszczyk W, Janik E, Presz A, Dłuzewski P, Kret S, Szuszkiewicz W, Morhange JF, Dynowska E, Kirmse H, Neumann W, Petroutchik A, Baczewski LT, Karczewski G, Wojtowicz T. Zaleszczyk W, et al. Among authors: dluzewski p. Nano Lett. 2008 Nov;8(11):4061-5. doi: 10.1021/nl802449g. Epub 2008 Oct 9. Nano Lett. 2008. PMID: 18842031
Influence of the Si cap layer on the SiGe islands morphology.
Zak M, Laval JY, Dłuzewski PA, Kret S, Yam V, Bouchier D, Fossard F. Zak M, et al. Among authors: dluzewski pa. Micron. 2009 Jan;40(1):122-5. doi: 10.1016/j.micron.2008.02.010. Epub 2008 Feb 23. Micron. 2009. PMID: 18395456
25 results