Constantoudis V - Search Results

1

Impact of Line Edge Roughness on ReRAM Uniformity and Scaling.

Constantoudis V, Papavieros G, Karakolis P, Khiat A, Prodromakis T, Dimitrakis P. Constantoudis V, et al. Materials (Basel). 2019 Nov 30;12(23):3972. doi: 10.3390/ma12233972. Materials (Basel). 2019. PMID: 31801205 Free PMC article.

2

Quantitative characterization of hierarchical multiscale surfaces of micro and nanostructured materials.

Papavieros G, Constantoudis V, Vouroutzis N, Gogolides E. Papavieros G, et al. Among authors: constantoudis v. Nanotechnology. 2023 Jul 19;34(40). doi: 10.1088/1361-6528/ace3c8. Nanotechnology. 2023. PMID: 37402362

3

Modeling of roughness evolution during the etching of inhomogeneous films: material-induced anomalous scaling.

Constantoudis V, Christoyianni H, Zakka E, Gogolides E. Constantoudis V, et al. Phys Rev E Stat Nonlin Soft Matter Phys. 2009 Apr;79(4 Pt 1):041604. doi: 10.1103/PhysRevE.79.041604. Epub 2009 Apr 23. Phys Rev E Stat Nonlin Soft Matter Phys. 2009. PMID: 19518242

4

How Different Are Fog Collection and Dew Water Harvesting on Surfaces with Different Wetting Behaviors?

Nioras D, Ellinas K, Constantoudis V, Gogolides E. Nioras D, et al. Among authors: constantoudis v. ACS Appl Mater Interfaces. 2021 Oct 13;13(40):48322-48332. doi: 10.1021/acsami.1c16609. Epub 2021 Sep 30. ACS Appl Mater Interfaces. 2021. PMID: 34590815

5

All-organic sulfonium salts acting as efficient solution processed electron injection layer for PLEDs.

Georgiadou DG, Vasilopoulou M, Palilis LC, Petsalakis ID, Theodorakopoulos G, Constantoudis V, Kennou S, Karantonis A, Dimotikali D, Argitis P. Georgiadou DG, et al. Among authors: constantoudis v. ACS Appl Mater Interfaces. 2013 Dec 11;5(23):12346-54. doi: 10.1021/am402991b. Epub 2013 Nov 19. ACS Appl Mater Interfaces. 2013. PMID: 24195694

6

Optical properties of high aspect ratio plasma etched silicon nanowires: fabrication-induced variability dramatically reduces reflectance.

Smyrnakis A, Almpanis E, Constantoudis V, Papanikolaou N, Gogolides E. Smyrnakis A, et al. Among authors: constantoudis v. Nanotechnology. 2015 Feb 27;26(8):085301. doi: 10.1088/0957-4484/26/8/085301. Epub 2015 Feb 3. Nanotechnology. 2015. PMID: 25648611

7

Measuring the randomness of micro- and nanostructure spatial distributions: Effects of scanning electron microscope image processing and analysis.

Mavrogonatos A, Papia EM, Dimitrakellis P, Constantoudis V. Mavrogonatos A, et al. Among authors: constantoudis v. J Microsc. 2023 Jan;289(1):48-57. doi: 10.1111/jmi.13149. Epub 2022 Oct 17. J Microsc. 2023. PMID: 36206502

8

Nonhyperbolic escape and changes in phase-space stability structures in laser-induced multiphoton dissociation of a diatomic molecule.

Constantoudis V, Nicolaides CA. Constantoudis V, et al. Phys Rev E Stat Nonlin Soft Matter Phys. 2001 Nov;64(5 Pt 2):056211. doi: 10.1103/PhysRevE.64.056211. Epub 2001 Oct 22. Phys Rev E Stat Nonlin Soft Matter Phys. 2001. PMID: 11736058

9

Scattering off two oscillating disks: dilute chaos.

Papachristou PK, Diakonos FK, Constantoudis V, Schmelcher P, Benet L. Papachristou PK, et al. Among authors: constantoudis v. Phys Rev E Stat Nonlin Soft Matter Phys. 2004 Nov;70(5 Pt 2):056215. doi: 10.1103/PhysRevE.70.056215. Epub 2004 Nov 19. Phys Rev E Stat Nonlin Soft Matter Phys. 2004. PMID: 15600736

10

Lyapunov instability versus relaxation time in two coupled oscillators.

Papachristou PK, Mavrommatis E, Constantoudis V, Diakonos FK, Wambach J. Papachristou PK, et al. Among authors: constantoudis v. Phys Rev E Stat Nonlin Soft Matter Phys. 2006 Jan;73(1 Pt 2):016204. doi: 10.1103/PhysRevE.73.016204. Epub 2006 Jan 6. Phys Rev E Stat Nonlin Soft Matter Phys. 2006. PMID: 16486255

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