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Quantification of Potential Drops Across Semiconductor Heterointerfaces Using 4D-STEM.
Microsc Microanal. 2023 Jul 22;29(Supplement_1):330-331. doi: 10.1093/micmic/ozad067.154.
Microsc Microanal. 2023.
PMID: 37613207
No abstract available.
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM.
Heimes D, Chejarla VS, Ahmed S, Hüppe F, Beyer A, Volz K.
Heimes D, et al. Among authors: chejarla vs.
Ultramicroscopy. 2023 Nov;253:113821. doi: 10.1016/j.ultramic.2023.113821. Epub 2023 Jul 26.
Ultramicroscopy. 2023.
PMID: 37562100
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Measuring Spatially-Resolved Potential Drops at Semiconductor Hetero-Interfaces Using 4D-STEM.
Chejarla VS, Ahmed S, Belz J, Scheunert J, Beyer A, Volz K.
Chejarla VS, et al.
Small Methods. 2023 Sep;7(9):e2300453. doi: 10.1002/smtd.202300453. Epub 2023 May 28.
Small Methods. 2023.
PMID: 37246264
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