Celano U - Search Results

1

Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO₂ Metal-Ferroelectric-Metal Memory.

Chang TY, Wang KC, Liu HY, Hseun JH, Peng WC, Ronchi N, Celano U, Banerjee K, Van Houdt J, Wu TL. Chang TY, et al. Among authors: celano u. Nanomaterials (Basel). 2023 Jul 19;13(14):2104. doi: 10.3390/nano13142104. Nanomaterials (Basel). 2023. PMID: 37513115 Free PMC article.

2

Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges.

Celano U, Gomez A, Piedimonte P, Neumayer S, Collins L, Popovici M, Florent K, McMitchell SRC, Favia P, Drijbooms C, Bender H, Paredis K, Di Piazza L, Jesse S, Van Houdt J, van der Heide P. Celano U, et al. Nanomaterials (Basel). 2020 Aug 11;10(8):1576. doi: 10.3390/nano10081576. Nanomaterials (Basel). 2020. PMID: 32796703 Free PMC article.

3

The flexoelectric effect in Al-doped hafnium oxide.

Celano U , Popovici M , Florent K , Lavizzari S , Favia P , Paulussen K , Bender H , di Piazza L , Van Houdt J , Vandervorst W . Celano U , et al. Nanoscale. 2018 May 10;10(18):8471-8476. doi: 10.1039/c8nr00618k. Nanoscale. 2018. PMID: 29691544

4

Revealing Antiferroelectric Switching and Ferroelectric Wakeup in Hafnia by Advanced Piezoresponse Force Microscopy.

Collins L, Celano U. Collins L, et al. Among authors: celano u. ACS Appl Mater Interfaces. 2020 Sep 16;12(37):41659-41665. doi: 10.1021/acsami.0c07809. Epub 2020 Sep 1. ACS Appl Mater Interfaces. 2020. PMID: 32870659

5

Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching Memory.

Celano U, Goux L, Degraeve R, Fantini A, Richard O, Bender H, Jurczak M, Vandervorst W. Celano U, et al. Nano Lett. 2015 Dec 9;15(12):7970-5. doi: 10.1021/acs.nanolett.5b03078. Epub 2015 Nov 3. Nano Lett. 2015. PMID: 26523952

6

Effects of buried grain boundaries in multilayer MoS₂.

Ludwig J, Mehta AN, Mascaro M, Celano U, Chiappe D, Bender H, Vandervorst W, Paredis K. Ludwig J, et al. Among authors: celano u. Nanotechnology. 2019 Jul 12;30(28):285705. doi: 10.1088/1361-6528/ab142f. Epub 2019 Mar 28. Nanotechnology. 2019. PMID: 30921772

7

Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity.

Chiappe D, Ludwig J, Leonhardt A, El Kazzi S, Nalin Mehta A, Nuytten T, Celano U, Sutar S, Pourtois G, Caymax M, Paredis K, Vandervorst W, Lin D, De Gendt S, Barla K, Huyghebaert C, Asselberghs I, Radu I. Chiappe D, et al. Among authors: celano u. Nanotechnology. 2018 Oct 19;29(42):425602. doi: 10.1088/1361-6528/aad798. Epub 2018 Aug 2. Nanotechnology. 2018. PMID: 30070657

8

Direct Probing of the Dielectric Scavenging-Layer Interface in Oxide Filamentary-Based Valence Change Memory.

Celano U, Op de Beeck J, Clima S, Luebben M, Koenraad PM, Goux L, Valov I, Vandervorst W. Celano U, et al. ACS Appl Mater Interfaces. 2017 Mar 29;9(12):10820-10824. doi: 10.1021/acsami.6b16268. Epub 2017 Mar 16. ACS Appl Mater Interfaces. 2017. PMID: 28266834

9

Direct imaging and manipulation of ionic diffusion in mixed electronic-ionic conductors.

Op de Beeck J , Labyedh N , Sepúlveda A , Spampinato V , Franquet A , Conard T , Vereecken PM , Celano U . Op de Beeck J , et al. Among authors: celano u. Nanoscale. 2018 Jul 9;10(26):12564-12572. doi: 10.1039/c8nr02887g. Nanoscale. 2018. PMID: 29932450

10

Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS.

Op de Beeck J, Labyedh N, Sepúlveda A, Spampinato V, Franquet A, Conard T, Vereecken PM, Vandervorst W, Celano U. Op de Beeck J, et al. Among authors: celano u. Beilstein J Nanotechnol. 2018 Jun 4;9:1623-1628. doi: 10.3762/bjnano.9.154. eCollection 2018. Beilstein J Nanotechnol. 2018. PMID: 29977696 Free PMC article.

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