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Effect of P-Type GaN Buried Layer on the Temperature of AlGaN/GaN HEMTs.
Lv H, Cao Y, Ma M, Wang Z, Zhang X, Chen C, Wu L, Lv L, Zheng X, Wang Y, Tian W, Ma X. Lv H, et al. Among authors: cao y. Micromachines (Basel). 2023 Jul 20;14(7):1457. doi: 10.3390/mi14071457. Micromachines (Basel). 2023. PMID: 37512768 Free PMC article.
Combined Effect of TID Radiation and Electrical Stress on NMOSFETs.
Cao Y, Wang M, Zheng X, Zhang E, Lv L, Wang L, Ma M, Lv H, Wang Z, Wang Y, Tian W, Ma X, Hao Y. Cao Y, et al. Micromachines (Basel). 2022 Oct 29;13(11):1860. doi: 10.3390/mi13111860. Micromachines (Basel). 2022. PMID: 36363882 Free PMC article.
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