Combined Effect of TID Radiation and Electrical Stress on NMOSFETs.
Cao Y, Wang M, Zheng X, Zhang E, Lv L, Wang L, Ma M, Lv H, Wang Z, Wang Y, Tian W, Ma X, Hao Y.
Cao Y, et al.
Micromachines (Basel). 2022 Oct 29;13(11):1860. doi: 10.3390/mi13111860.
Micromachines (Basel). 2022.
PMID: 36363882
Free PMC article.