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Page 1
We take it personally.
Bonnell DA, Buriak JM, Chan WC, Hafner JH, Hammond PT, Hersam MC, Javey A, Kotov NA, Nel AE, Nordlander PJ, Parak WJ, Penner RM, Rogach AL, Schaak RE, Stevens MM, Wee AT, Willson CG, Weiss PS. Bonnell DA, et al. ACS Nano. 2012 Dec 21;6(12):10417-9. doi: 10.1021/nn305696y. ACS Nano. 2012. PMID: 23256549 No abstract available.
Recycling is not always good: the dangers of self-plagiarism.
Bonnell DA, Hafner JH, Hersam MC, Kotov NA, Buriak JM, Hammond PT, Javey A, Nordlander P, Parak WJ, Schaak RE, Wee AT, Weiss PS, Rogach AL, Stevens MM, Willson CG. Bonnell DA, et al. ACS Nano. 2012 Jan 24;6(1):1-4. doi: 10.1021/nn3000912. ACS Nano. 2012. PMID: 22268423 No abstract available.
Long-term impact.
Weiss PS, Bonnell DA, Hammond PT, Willson CG, Lewis PA. Weiss PS, et al. Among authors: bonnell da. ACS Nano. 2008 Dec 23;2(12):2425-6. doi: 10.1021/nn800839h. ACS Nano. 2008. PMID: 19206273 No abstract available.
ACS Nano. Our paper anniversary.
Weiss PS, Bonnell DA, Hammond PT, Willson CG, Lewis PA. Weiss PS, et al. Among authors: bonnell da. ACS Nano. 2008 Aug;2(8):1505-6. doi: 10.1021/nn800484t. ACS Nano. 2008. PMID: 19206351 No abstract available.
Plasmon-induced electrical conduction in molecular devices.
Banerjee P, Conklin D, Nanayakkara S, Park TH, Therien MJ, Bonnell DA. Banerjee P, et al. Among authors: bonnell da. ACS Nano. 2010 Feb 23;4(2):1019-25. doi: 10.1021/nn901148m. ACS Nano. 2010. PMID: 20095631
35 results