Advanced atomic force microscopy techniques.
Glatzel T, Hölscher H, Schimmel T, Baykara MZ, Schwarz UD, Garcia R.
Glatzel T, et al. Among authors: baykara mz.
Beilstein J Nanotechnol. 2012;3:893-4. doi: 10.3762/bjnano.3.99. Epub 2012 Dec 21.
Beilstein J Nanotechnol. 2012.
PMID: 23365802
Free PMC article.
No abstract available.