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Role of Electrical Double Layer Structure in Ionic Liquid Gated Devices.
Black JM, Come J, Bi S, Zhu M, Zhao W, Wong AT, Noh JH, Pudasaini PR, Zhang P, Okatan MB, Dai S, Kalinin SV, Rack PD, Ward TZ, Feng G, Balke N. Black JM, et al. Among authors: balke n. ACS Appl Mater Interfaces. 2017 Nov 22;9(46):40949-40958. doi: 10.1021/acsami.7b11044. Epub 2017 Nov 7. ACS Appl Mater Interfaces. 2017. PMID: 29063758
Exploring topological defects in epitaxial BiFeO3 thin films.
Vasudevan RK, Chen YC, Tai HH, Balke N, Wu P, Bhattacharya S, Chen LQ, Chu YH, Lin IN, Kalinin SV, Nagarajan V. Vasudevan RK, et al. Among authors: balke n. ACS Nano. 2011 Feb 22;5(2):879-87. doi: 10.1021/nn102099z. Epub 2011 Jan 7. ACS Nano. 2011. PMID: 21214267
83 results