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Spatially Resolved Spectroscopic Extreme Ultraviolet Reflectometry for Laboratory Applications.
J Nanosci Nanotechnol. 2019 Jan 1;19(1):562-567. doi: 10.1166/jnn.2019.16470.
J Nanosci Nanotechnol. 2019.
PMID: 30327070
Characterization of nanoscale gratings by spectroscopic reflectometry in the extreme ultraviolet with a stand-alone setup.
Bahrenberg L, Danylyuk S, Glabisch S, Ghafoori M, Schröder S, Brose S, Stollenwerk J, Loosen P.
Bahrenberg L, et al.
Opt Express. 2020 Jul 6;28(14):20489-20502. doi: 10.1364/OE.396001.
Opt Express. 2020.
PMID: 32680107
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Design of structured YAG:Ce scintillators with enhanced outcoupling for image detection in the extreme ultraviolet.
Bahrenberg L, Herbert S, Mathmann T, Danylyuk S, Stollenwerk J, Loosen P.
Bahrenberg L, et al.
Opt Lett. 2017 Oct 1;42(19):3848-3851. doi: 10.1364/OL.42.003848.
Opt Lett. 2017.
PMID: 28957170
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