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Charge trapping by self-assembled monolayers as the origin of the threshold voltage shift in organic field-effect transistors.
Small. 2012 Jan 23;8(2):241-5. doi: 10.1002/smll.201101467. Epub 2011 Nov 25.
Small. 2012.
PMID: 22121119
Revealing buried interfaces to understand the origins of threshold voltage shifts in organic field-effect transistors.
Mathijssen SG, Spijkman MJ, Andringa AM, van Hal PA, McCulloch I, Kemerink M, Janssen RA, de Leeuw DM.
Mathijssen SG, et al. Among authors: andringa am.
Adv Mater. 2010 Dec 1;22(45):5105-9. doi: 10.1002/adma.201001865.
Adv Mater. 2010.
PMID: 20859942
No abstract available.
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Analysis of Nanoporosity in Moisture Permeation Barrier Layers by Electrochemical Impedance Spectroscopy.
Perrotta A, García SJ, Michels JJ, Andringa AM, Creatore M.
Perrotta A, et al. Among authors: andringa am.
ACS Appl Mater Interfaces. 2015 Jul 29;7(29):15968-77. doi: 10.1021/acsami.5b04060. Epub 2015 Jul 15.
ACS Appl Mater Interfaces. 2015.
PMID: 26147606
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Low-Temperature Plasma-Assisted Atomic Layer Deposition of Silicon Nitride Moisture Permeation Barrier Layers.
Andringa AM, Perrotta A, de Peuter K, Knoops HC, Kessels WM, Creatore M.
Andringa AM, et al.
ACS Appl Mater Interfaces. 2015 Oct 14;7(40):22525-32. doi: 10.1021/acsami.5b06801. Epub 2015 Sep 30.
ACS Appl Mater Interfaces. 2015.
PMID: 26393381
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